The Implementation of the dynamics analysis spectrometer DNA; The Pedigree of the backscattering neutron spectrometer

Shibata, Kaoru

Hamon, 28(1), p.26 - 28, 2018/02

https://doi.org/10.5611/hamon.28.1_26

We briefly introduce the pedigree of the backscattering neutron spectrometer and the specification of DNA; a time-of-flight (TOF) type near-backscattering spectrometer (n-BSS), with Si crystal analyzers which was constructed at the Materials and Life Science Experimental Facility (MLF) of the Japan Proton Accelerator Research Complex (J-PARC).

A Time-of-flight type near backscattering spectrometer DNA in J-PARC

Shibata, Kaoru

no journal, , 

A time-of-flight (TOF) type near-backscattering spectrometer (n-BSS), DNA was built and started operation in 2012 at the Materials and Life Science Experimental Facility (MLF) of the Japan Proton Accelerator Research Complex (J-PARC). DNA is a unique instrument among spallation pulsed neutron facilities over the world in terms of n-BSS equipped with a high-speed pulse-shaping disc-chopper. On the other hand Si crystal analyzers with back-coated by neutron absorber extremely reduces unfavorable background scattering of the instrument so as to reach signal-to-noise ratio of ~100,000. Those factors gave big advantage to enlarge application fields to dynamical behaviors of atoms and spins in bio-molecules, soft-materials and strongly-correlated electron system in nanosecond timescale or in micro-eV energy region. I will present the performance of DNA spectrometer and their research results.

Study of the neutron absorbers materials coated on the back side of analyzer silicon crystal wafer

Shibata, Kaoru

no journal, , 

The silicon crystal analyzer is an important spectroscopic device for high energy resolution neutron inelastic backscattering spectrometer. Specification of this spectroscopic device is thought to determine energy resolution and background. In order to achieve a low background spectrum without degradation of the energy resolution, it was developed new crystal analyzer which were constracted by Si wafers coated by thin film of neutron absorbers on the back side of Si wafer, and used it for the new backscattering spectrometer DNA in MLF at J-PARC which were able to achieve the desired performance.

Current status and upgrade plan of neutron backscattering spectrometer DNA

Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Tamatsukuri, Hiromu; Nakagawa, Hiroshi; Ouchi, Keiichi*

no journal, ,